High Performance 4nm FinFET Platform (4LPE) with Novel Advanced Transistor Level DTCO for Dual-CPP/HP-HD Standard Cells

Autor:	Yuri Yasuda-Masuoka, Jaehun Jeong, Kihwang Son, SeungWook Lee, Seulki Park, Youngho Lee, Ju Youn Kim, Jaeho Lee, Moongi Cho, Sihyung Lee, Soohun Hong, Heebum Hong, Younghun Jung, Changkeun Yoon, Yonghyun Ko, Kyunghoon Jung, Taehun Myung, Jong Mil Youn, Gitae Jeong
Rok vydání:	2021
Zdroj:	2021 IEEE International Electron Devices Meeting (IEDM).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b6ed776a19715b49489ce62a2a6dafe1 https://doi.org/10.1109/iedm19574.2021.9720656 Zobrazit plný text záznamu