Automatic control system for memory chips performance in a radiation experiment

Autor:	N. G. Grigor’ev, A. A. Orlov, A. Y. Nikiforov, A.V. Ulanova, Anna B. Boruzdina
Rok vydání:	2015
Předmět:	Engineering Automatic test equipment Hardware_MEMORYSTRUCTURES Automatic control business.industry Test algorithm Embedded system Static random-access memory Memory refresh business Computer hardware Experimental research
Zdroj:	2015 International Siberian Conference on Control and Communications (SIBCON).
DOI:	10.1109/sibcon.2015.7147007
Popis:	The paper analyzes the effectiveness of test algorithms of different duration during the functional control of static random access memory (SRAM) during the exposure to total ionizin dose (TID). The results of experimental research SRAM chips using an automated system based on the equipment «PXI» company National Instruments, justifying the use of the test algorithms such as “MARCH” (long-10N).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b6dc6688471bb0cda32e1b1ff6aca507 https://doi.org/10.1109/sibcon.2015.7147007 Zobrazit plný text záznamu