MOSFETs SEB & SEGR Qualification Results with SOA Estimation
Autor: | Kais B. Bu-Khasan, Timofey A. Maksimenko, Aleksandr M. Chlenov, Sergey A. Iakovlev, Aleksandr E. Koziukov, Pavel A. Chubunov, Vasily S. Anashin |
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Rok vydání: | 2017 |
Předmět: | |
Zdroj: | 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS). |
Popis: | the paper presents single event effects (SEE) test results for some commercial power MOSFETs obtained at Roscosmos SEE Test Facilities during test campaign in October 2016. |
Databáze: | OpenAIRE |
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