MOSFETs SEB & SEGR Qualification Results with SOA Estimation

Autor: Kais B. Bu-Khasan, Timofey A. Maksimenko, Aleksandr M. Chlenov, Sergey A. Iakovlev, Aleksandr E. Koziukov, Pavel A. Chubunov, Vasily S. Anashin
Rok vydání: 2017
Předmět:
Zdroj: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Popis: the paper presents single event effects (SEE) test results for some commercial power MOSFETs obtained at Roscosmos SEE Test Facilities during test campaign in October 2016.
Databáze: OpenAIRE