Fatigue Reliability Analysis Framework for Medical Devices Based on a Probabilistic Finite Element Approach

Autor:	Hengchu Cao, Venkateswaran Shanmugam, Abhijeet Joshi, Paul A. Schmidt, William Krams, Tianwen Zhao
Rok vydání:	2019
Předmět:	Computer science business.industry Finite element approach Monte Carlo method Structural reliability Probabilistic logic Fatigue stress Structural engineering business Fatigue limit Reliability (statistics) Finite element method
DOI:	10.1520/stp161620180038
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b624e01f7b32d51569c2d1ab1be8c6ef https://doi.org/10.1520/stp161620180038 Zobrazit plný text záznamu