MEMRISTOR STRUCTURES BASED ON THIN SI3N4 LAYERS AND CHARGE TRANSPORT MECHANISM RESEARCH

Autor: Vladimir A. Gritsenko, Andrey Gismatulin, Oleg M. Orlov
Rok vydání: 2020
Předmět:
Zdroj: International Forum “Microelectronics – 2020”. Joung Scientists Scholarship “Microelectronics – 2020”. XIII International conference «Silicon – 2020». XII young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis.
DOI: 10.29003/m1651.silicon-2020/364-368
Popis: The article describes promising directions of development of non-volatile resistive memory ReRAM. Silicon nitride is a promising resistive switching layer for memristors. In this work we conducted an experimental researches of the switching effect and charge transport in memristores based on silicon nitride.
Databáze: OpenAIRE