| Autor: |
James Chien-Mo Li, Chris Nigh, Mu-Ting Wu, Chih-Yan Liu, Gaurav Bhargava |
| Rok vydání: |
2020 |
| Předmět: |
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| Zdroj: |
ATS |
| Popis: |
Hold-time faults can occur in complex designs but can be difficult to diagnose. This paper presents a systematic hold-time diagnosis method for logic circuits. A four-phase flow is introduced to solve the problem. The identification phase identifies groups of systematic error logs by systematic errors. The filtering phase builds a majority error log to avoid the effect of random defects. The verification phase verifies that the candidate fault is a hold-time fault and recognizes capture flip-flops. The determination phase determines the fault models and their corresponding faulty flip-flops. Experiments on two industrial cases show the effectiveness of our technique, both of which have been verified through root-cause analysis. The proposed technique outperforms standard diagnosis performed by a commercial tool. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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