Correlation of Picosecond Laser-Induced Latchup and Energetic Particle-Induced Latchup in CMOS Test Structures
Autor: | W. R. Crain, K. P. MacWilliams, J. R. Scarpulla, S. D. Lalumondiere, S. C. Moss |
---|---|
Rok vydání: | 2000 |
Databáze: | OpenAIRE |
Externí odkaz: |