Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol

Autor:	J. Seliskar, J.A. Miller, Frederick T. Brady, N.F. Haddad, L.K. Wang
Rok vydání:	2005
Předmět:	Random access memory Materials science Temperature sensitivity CMOS business.industry Thin film circuits Mode (statistics) Electrical engineering Optoelectronics business Degradation (telecommunications) Electronic circuit Threshold voltage
Zdroj:	IEEE International SOI Conference.
DOI:	10.1109/soi.1992.664809
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b5b126b78fab7f9d345ae501bb16d90c https://doi.org/10.1109/soi.1992.664809 Zobrazit plný text záznamu