Scanning spectrotomography of inhomogeneous surface layers
| Autor: | A. Yu. Tsivadze, V. A. Kotenev, D. N. Tyurin |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Surface (mathematics)
Materials science business.industry General Chemical Engineering Metals and Alloys Oxide Inorganic Chemistry Wavelength chemistry.chemical_compound Optics chemistry Nondestructive testing Materials Chemistry Composite material Reflectometry business Chemical composition Layer (electronics) |
| Zdroj: | Inorganic Materials. 45:1622-1625 |
| ISSN: | 1608-3172 0020-1685 |
| Popis: | Methodical bases of specular-reflection scanning spectrotomography for diagnostics of phase-inhomogeneous surface layers are presented. Digital optical images of a metal surface with an inhomogeneous layer, obtained at different wavelengths, can be processed using optical spectrotomography algorithms modified as applied to reflectometry. This allows thickness and chemical composition control of inhomogeneous surface layers. The method was tested for nondestructive evaluation of thickness and chemical composition of an oxide layer on the surface of thermally treated Kh18N10T steel. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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