A single event upset tolerant latch with parallel nodes

Autor:	Chunyu Peng, Zhao Qiang, Li Xuan, Xuan Zeng, Changyong Liu, Zhiting Lin, Xiulong Wu, Liu Nianlong, Junning Chen, Xiangdong Hu
Rok vydání:	2019
Předmět:	Single event upset Computer science business.industry Embedded system Electrical and Electronic Engineering Condensed Matter Physics business Electronic Optical and Magnetic Materials
Zdroj:	IEICE Electronics Express. 16:20190208-20190208
ISSN:	1349-2543
DOI:	10.1587/elex.16.20190208
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b5908deb6d28d9937a749fefa49adb84 https://doi.org/10.1587/elex.16.20190208 Zobrazit plný text záznamu