Oriented Growth of ZnO Crystals on Self-Assembled Monolayers of Functionalized Alkyl Silanes
| Autor: | M. Deutsch, Aharon Gedanken, C. N. Sukenik, O. Palchik, B. M. Ocko, O. Gershevitz, R. Turgeman |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
chemistry.chemical_classification
Silanes Materials science Self-assembled monolayer General Chemistry engineering.material Condensed Matter Physics Contact angle chemistry.chemical_compound Crystallography chemistry Coating Ellipsometry Monolayer engineering General Materials Science Self-assembly Alkyl |
| Zdroj: | Crystal Growth & Design. 4:169-175 |
| ISSN: | 1528-7505 1528-7483 |
| DOI: | 10.1021/cg0340953 |
| Popis: | Highly ordered ZnO crystals of 0.15 μm width and 0.5 μm length were grown on silicon wafers coated with a monolayer of SiCl3(CH2)11−O−C6H5 molecules. Various techniques (contact angle measurements, ellipsometry, ATR-FTIR) were employed for determining the quality of the monolayer coating. In addition, the bare and silane-coated Si wafers were studied by X-ray reflectivity (XR) and grazing-incidence diffraction (GID) using synchrotron radiation. The results obtained point to a possible relationship between the organization of the self-assembled monolayer (SAM) coating, the dipole moment of the headgroup, and the orientation of the ZnO crystals. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|