Heavy Ion and Proton Test Results for Micron 4 Gb NAND Flash Memory
| Autor: | Paul Dudek, Kodie Altvater, Douglas Jaeger, John Lindley, Brainton Song, James Hack, Deas Brown, Thomas Tittel, Ellwood Lane |
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| Rok vydání: | 2016 |
| Předmět: |
Hardware_MEMORYSTRUCTURES
Materials science Proton 010308 nuclear & particles physics Nand flash memory business.industry Hardware_PERFORMANCEANDRELIABILITY 01 natural sciences Electronic mail Ion 0103 physical sciences Electronic engineering Optoelectronics Heavy ion Transient (oscillation) High current business |
| Zdroj: | 2016 IEEE Radiation Effects Data Workshop (REDW). |
| DOI: | 10.1109/nsrec.2016.7891716 |
| Popis: | This paper describes the methodology and test results from heavy ion and proton testing of the Micron 4 Gb NAND flash memory, with particular attention to characterization of the transient high current effect previously observed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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