Quantitative Characterization of Platinum Diselenide Electrical Conductivity With an Inverted Scanning Microwave Microscope

Autor:	Xiaopeng Wang, Xin Jin, Antonio Morini, C. H. Joseph, Davide Mencarelli, Richard Al Hadi, Gianluca Fabi, Marco Farina, Eleonora Pavoni, Andrea Di Donato, James C. M. Hwang
Rok vydání:	2021
Předmět:	Radiation Microscope Materials science business.industry Condensed Matter Physics Semimetal law.invention Characterization (materials science) Diselenide law Microscopy Calibration Optoelectronics Equivalent circuit Electrical and Electronic Engineering business Microwave
Zdroj:	IEEE Transactions on Microwave Theory and Techniques. 69:3348-3359
ISSN:	1557-9670 0018-9480
Popis:	Near-field scanning microwave microscopy is a technique with increasing popularity for the study of nanometer-scale electrical properties of samples. Here, we present an approach to quantify sample properties in images obtained with an inverted scanning microwave microscope (iSMM), recently introduced by our group. In particular, this study reports the analysis of the local electrical conductivity of a platinum diselenide sample and proves its semimetal behavior. The approach is validated by a full-wave numerical model, reproducing the complete iSMM operation as well as all steps of the calibration algorithms. To extract local sample properties, this article provides two calibration procedures, respectively, for transmission and reflection mode measurements, based on a two-port equivalent circuit of the iSMM. This enables the high-frequency quantitative characterization of a wide variety of samples and surfaces.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b56297113bc43e710fb357ff1dc4d3a7 https://doi.org/10.1109/tmtt.2021.3072374 Zobrazit plný text záznamu