Near infra-red wavelength metrology with semiconductor diode lasers
| Autor: | A. Andersson-Faldt, O. Carlsson, L.R. Pendrill |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Distributed feedback laser
Materials science business.industry Far-infrared laser Physics::Optics Laser Vertical-cavity surface-emitting laser Semiconductor laser theory law.invention Optics law Diode-pumped solid-state laser Optoelectronics Semiconductor optical gain Physics::Atomic Physics business Tunable laser |
| Zdroj: | 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254). |
| DOI: | 10.1109/cpem.1998.701545 |
| Popis: | A laser spectral measurement facility has been developed in response to needs for the accurate determination of laser wavelength in the near infrared spectral region in a diversity of applications (fundamental constant determination, optical DWDM communication, environmental spectroscopy, ...). The facility is based on a number of frequency-stabilised grating cavity lasers, atomic and molecular reference cells and optical interferometers. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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