About the Sensitivity of in Situ Diffraction Measurements with X-Radiation of a Laser-Produced Plasma

Autor:	E. Förster, P. Glas, K. Goetz, St. Joksch, P. V. Nickles, M. Schnürer, I. Will
Rok vydání:	1988
DOI:	10.1515/9783112495223-009
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b541a837bf60dac330a7cd4fb38779c8 https://doi.org/10.1515/9783112495223-009 Zobrazit plný text záznamu