Case Studies: Masked read-only memory failure fault isolation without bitmapping

Autor:	BL Yeoh, C. Shaalini, MH Thor, YH Chan, WF Soh, SH Goh, Wiswa Naradha, LS Gan
Rok vydání:	2021
Předmět:	Read-only memory business.industry Computer science Embedded system Bitmap computer.file_format business computer Fault detection and isolation
Zdroj:	2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
DOI:	10.1109/ipfa53173.2021.9617404
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b530dc538c08b6622cd83cdbbc80da99 https://doi.org/10.1109/ipfa53173.2021.9617404 Zobrazit plný text záznamu