Autor: |
Valdas Jokubavicius, Michl Kaiser, Mikael Syväjärvi, Thomas Hupfer, Philip Hens, Peter J. Wellmann |
Rok vydání: |
2013 |
Předmět: |
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Zdroj: |
Materials Science Forum. :52-55 |
ISSN: |
1662-9752 |
DOI: |
10.4028/www.scientific.net/msf.740-742.52 |
Popis: |
Ballistic and diffusive growth regimes in the Fast Sublimation Growth Process of silicon carbide can be determined using suggested theoretical model for the mean free path calculations. The influences of temperature and inert gas pressure on the mass transport for the growth of epitaxial layers were analyzed theoretically and experimentally. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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