An improved method for determining carrier densities via drive level capacitance profiling
| Autor: | Ellis T. Roe, William N. Shafarman, Charles W. Warren, D. Westley Miller, Mark C. Lonergan |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Physics and Astronomy (miscellaneous) Analytical chemistry Improved method 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Diffusion capacitance Capacitance symbols.namesake Amplitude 0103 physical sciences Taylor series symbols Electronic engineering 0210 nano-technology |
| Zdroj: | Applied Physics Letters. 110:203901 |
| ISSN: | 1077-3118 0003-6951 |
| Popis: | We demonstrate that an analytic relationship between coefficients in the Taylor expansion of the junction capacitance can be exploited to yield more precise determinations of carrier densities in drive level capacitance profiling (DLCP). Improvements are demonstrated on data generated according to the DLCP theory and in measurements performed on a CuInxGa1–xSe2 device. We argue that the improved DLCP method is especially important for non-uniform devices, which are more susceptible to noise in the capacitance data used in DLCP because they require that the amplitude of the drive level be restricted. Importantly, the analysis does not require the collection of any data other than what is typically collected during a DLCP measurement while employing fewer independent parameters than the model that is typically used in DLCP. Thus, we expect that it will be readily adoptable by those who perform DLCP measurements. |
| Databáze: | OpenAIRE |
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