The L-shell ionization of Ho and Os induced by electron impact

Autor:	Chengjun Gou, Xiufeng Peng, Zhengming Luo, Zhangwen Wu, Fuqing He, Dailun Yang
Rok vydání:	2006
Předmět:	Multidisciplinary chemistry Ionization chemistry.chemical_element Osmium Substrate (electronics) Electron Atomic physics Holmium Electron transport chain Electron ionization L-shell
Zdroj:	Chinese Science Bulletin. 51:1929-1933
ISSN:	1861-9541 1001-6538
DOI:	10.1007/s11434-006-2051-y
Popis:	The electron-induced L-shell X-ray partial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influence of the electrons reflected from the substrate was corrected by using the electron transport bipartition model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b4cb900a59ccd736114562a7524eb488 https://doi.org/10.1007/s11434-006-2051-y Zobrazit plný text záznamu Full text from SpringerLink