Diffracted-beam analyzer with multiple single crystals for high resolution parallelbeam X-ray diffraction

Autor:	H. Toraya
Rok vydání:	2009
Předmět:	Inorganic Chemistry Diffraction Spectrum analyzer Materials science Optics business.industry X-ray crystallography High resolution General Materials Science Condensed Matter Physics business Beam (structure)
Zdroj:	Zeitschrift für Kristallographie Supplements. 2009:177-182
ISSN:	0930-486X
DOI:	10.1524/zksu.2009.0025
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b48b100406a1835d7966cb90b1652f7f https://doi.org/10.1524/zksu.2009.0025 Zobrazit plný text záznamu