Microwave characterization and modeling of the surface impedance of fractal structure copper films
| Autor: | E. Troncet, G. Ablart, L. Allam |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Diffraction
Materials science business.industry Astrophysics::Instrumentation and Methods for Astrophysics Characterization (materials science) symbols.namesake Printed circuit board Optics Fractal Maxwell's equations symbols Wave impedance Electrical and Electronic Engineering business Electrical impedance Microwave |
| Zdroj: | IEEE Transactions on Antennas and Propagation. 46:434-441 |
| ISSN: | 0018-926X |
| DOI: | 10.1109/8.662663 |
| Popis: | The surface impedances of two thin metallic films of different fractal structures realized on printed circuits have been measured in free-space over the frequency range [10 GHz-20 GHz]. A modeling scheme based on Maxwell's equations and Fresnel's diffraction theory is proposed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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