| Popis: |
As the demand and production volume for embedded flash MCUs increase, their flash memory test time reduction is getting more important. Among them, trimming test occupies to a certain extent. To decrease it, a dedicated on-chip test circuit of a current comparator can be an answer, but such a current comparator tends to consume large area when high precision is needed. In this paper, we proposed a new current judgement circuit for reference current trimming, of small area and high precision. A test chip of 110 nm process embedded flash memory for MCUs with the new trimming circuit has been fabricated and the new circuit effects have been confirmed by the test chip. The 0.59 percent of Flash macro size can be reduced with this proposed auto-trimming circuit. |
