A Deep Learning Approach for Yield Estimation and Phenotype Analysis in Rice Crops

Autor: P. Devaki, Prekshaa Arunachalam, K.S Arun Sankar, M Venu Prasanna
Rok vydání: 2021
Zdroj: 2021 International Conference on Advancements in Electrical, Electronics, Communication, Computing and Automation (ICAECA).
DOI: 10.1109/icaeca52838.2021.9675671
Databáze: OpenAIRE