| Autor: |
S. Thakur, J. S. Misal, N. K. Sahoo, K. D. Rao, P. Sarkar, S. Jena, R. B. Tokas |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings. |
| ISSN: |
0094-243X |
| Popis: |
Atomic force acoustic microscopy (AFAM) is a useful nondestructive technique for measurement of local elastic modulus of materials at nano-scale spatial resolution by measuring the contact resonance spectra for higher order modes of the AFM cantilever. The elastic modulus of RF sputtered HfO2 thin film has been measured quantitatively, using reference approach in which measurements are performed on the test and reference samples. Using AFAM, the measured elastic modulus of the HfO2 thin film is 223±27 GPa, which is in agreement with the literature value of 220±40 GPa for atomic layer deposited HfO2 thin film using nanoindentation technique. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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