X-ray diffraction and positron annihilation life-time spectroscopy studies of polymetalloorganosiloxanes
| Autor: | V. I. Razov, V. O. Trukhin, V. V. Vasilieva, N. P. Shapkin, M. I. Balanov, S. V. Gardionov |
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| Rok vydání: | 2016 |
| Předmět: |
Physics
Annihilation Ionic radius Valence (chemistry) Solid-state physics 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Molecular physics 0104 chemical sciences PMOS logic Ion Inorganic Chemistry Crystallography X-ray crystallography Materials Chemistry Physics::Accelerator Physics Physical and Theoretical Chemistry 0210 nano-technology Spectroscopy |
| Zdroj: | Journal of Structural Chemistry. 57:507-511 |
| ISSN: | 1573-8779 0022-4766 |
| DOI: | 10.1134/s0022476616030124 |
| Popis: | X-ray diffractometry and positron annihilation life-time spectroscopy are applied to study the structural features of polymetallophenylsiloxane (PMOS) samples with the Si/M ratio corresponding to the metal valence state, namely, interplanar spacings (d 001), coherentscattering region (CSR) sizes, cross-section areas of polymer chains (s) calculated by the Miller-Boyer method, and the degree of amorphousness (β). It is demonstrated that the direct proportional dependence between the logarithm of the interplanar spacing d 001 and the logarithm of the cross-section area s is observed for PMOSs. This is an inverse dependence relative to changes in the crystal chemical ion radius. The extraction of the iron ion from polyferrophenylsiloxane leads to a sharp decrease in the interplanar spacing, which turns out to be less than d 001 in polyphenylsiloxanes, and also CSR increases due to a decrease in the diameter of the polymer chain. The positron annihilation life-time spectroscopy data show the observed direct dependence of the annihilation intensity (I 3), the annihilation rate (K 3), the degree of amorphousness on the PMOS cross-section area. |
| Databáze: | OpenAIRE |
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