Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy
| Autor: | G. Mangamma, Prasana Sahoo, Sitaram Dash, A. Rajesh, Mohammed Kamruddin |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Spin coating Nanostructure Materials science business.industry Schottky barrier 02 engineering and technology Conductive atomic force microscopy Conductivity 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Electronic Optical and Magnetic Materials Characterization (materials science) 0103 physical sciences Optoelectronics Nanorod 0210 nano-technology business Nanoscopic scale |
| Zdroj: | Ferroelectrics. 519:157-163 |
| ISSN: | 1563-5112 0015-0193 |
| Popis: | Here we present the local electrical characterization of individual ZnO nanorods (NRs) synthesized by spin coating method using precursor sol. Conductive atomic force microscopy (CAFM) was employed for investigating the local conductivity of these ZnO NRs. I-V curves studies on hexagonal top planes and rectangular side planes have shown nano-Schottky contact between ZnO NRs and tip. The Schottky barrier heights (SBHs) have been calculated to ∼0.63 eV, and ∼0.55 eV for these planes which are attributed to the polar and nonpolar faces respectively. This work provides a path way for constructing highly integrated nanoscale electronic devices with precise control. |
| Databáze: | OpenAIRE |
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