A TEM Study of Bubbles Growth with Temperature in Xenon and Krypton Implanted Uranium Dioxide
| Autor: | C. Sabathier, G. Carlot, Amélie Michel, Philippe Garcia, S. Bouffard, M. Cabié |
|---|---|
| Rok vydání: | 2012 |
| Předmět: |
education.field_of_study
Radiation Number density Materials science Annealing (metallurgy) Krypton Population Uranium dioxide Radiochemistry Analytical chemistry chemistry.chemical_element Condensed Matter Physics Microstructure Fluence chemistry.chemical_compound Xenon chemistry General Materials Science education |
| Zdroj: | Defect and Diffusion Forum. :191-196 |
| ISSN: | 1662-9507 |
| DOI: | 10.4028/www.scientific.net/ddf.323-325.191 |
| Popis: | Transmission electron microscopy (TEM) characterizations were carried out on a set of UO2 thin foils previously implanted at room temperature with 400 keV Xe2+ and 250 keV Kr2+ ions at the fluence 7.1015 at.cm-2 (equivalent to 1 at.%/at. UO2). The experiment was devoted to the study of the evolution of the fission gases bubbles populations with increasing temperature. Annealings were performed in the laboratory furnace at 600°C, 800°C, 1000°C for 12h, 1400°C for 4h and 1500°C for 2h under Ar-5%H2 atmosphere. For each annealing condition and for as-implanted specimens the bubble population has been characterized in size and number density. A comparison between Xe and Kr has been done that showed a similar behaviour. Globally, from the as-implanted sample to the 1500°C annealed, the bubbles growth phenomenon and the microstructure evolution with temperature was put in relieve. |
| Databáze: | OpenAIRE |
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