Correspondence among PL measurement, MBIC measurement and defect delineation in polycrystalline cast-Si solar cells

Autor:	Hitoshi Kawanami, Ryuichi Shimokawa, Yusaku Kashiwagi, Michio Tajima, Masatoshi Warashina
Rok vydání:	1997
Předmět:	Photoluminescence Materials science Silicon Renewable Energy Sustainability and the Environment business.industry chemistry.chemical_element Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention chemistry law Solar cell Optoelectronics Crystallite business
Zdroj:	Solar Energy Materials and Solar Cells. 48:85-91
ISSN:	0927-0248
Popis:	We report the correspondence between the photoluminescence (PL) measurement, monochromatic-light-beam-induced current (MBIC) measurement and defect delineation in polycrystalline cast-Si solar cells. It was found that the peak of the band-edge PL emission in the hydrogenerated and non-hydrogenerated cast-Si shifted from 1.093 eV in the single crystalline CZ-Si to 1.075 eV at room temperature and the band-edge PL mapping corresponded with the MBIC mapping and defect delineation pattern if excluding the surface damages delineated by the MD-1 etchant.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b2d0de04f2ce5f2b32096eb12e93b2a9 https://doi.org/10.1016/s0927-0248(97)00073-1 Zobrazit plný text záznamu Full Text from ScienceDirect