TEM characterization of GaSb grown on single crystal offcut Silicon (001)
| Autor: | Ian MacLaren, M. J. Steer, Alan J. Craven, H. L. Porter, I.G. Thayne, Damien McGrouther |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Silicon business.industry chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Characterization (materials science) chemistry 0103 physical sciences Optoelectronics 0210 nano-technology business Instrumentation Single crystal |
| Zdroj: | Microscopy and Microanalysis. 23:1476-1477 |
| ISSN: | 1435-8115 1431-9276 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|