Novel Top-coat Materials Containing a Bulky Silicon Group for ArF Immersion Lithography
Autor: | Man-Hyoung Ryoo, Sang-Jun Choi, Han-Ku Cho, Mitsuhiro Hata |
---|---|
Rok vydání: | 2006 |
Předmět: | |
Zdroj: | Journal of Photopolymer Science and Technology. 19:579-583 |
ISSN: | 1349-6336 0914-9244 |
Popis: | Novel alkaline developable top-coat materials containing a bulky silicon group are presented. This bulky silicon group endows transparency at 193nm wavelength and hydrophobicity to the top-coat. Good pattern profiles and negligible changes of lithographic performance are confirmed on ArF photoresists. Receding angle of this top-coat is 90o, which is the highest among alkaline developable top-coats reported to date, and only comparable by solvent soluble-typetop-coat TSP3A. |
Databáze: | OpenAIRE |
Externí odkaz: |