Novel Top-coat Materials Containing a Bulky Silicon Group for ArF Immersion Lithography

Autor: Man-Hyoung Ryoo, Sang-Jun Choi, Han-Ku Cho, Mitsuhiro Hata
Rok vydání: 2006
Předmět:
Zdroj: Journal of Photopolymer Science and Technology. 19:579-583
ISSN: 1349-6336
0914-9244
Popis: Novel alkaline developable top-coat materials containing a bulky silicon group are presented. This bulky silicon group endows transparency at 193nm wavelength and hydrophobicity to the top-coat. Good pattern profiles and negligible changes of lithographic performance are confirmed on ArF photoresists. Receding angle of this top-coat is 90o, which is the highest among alkaline developable top-coats reported to date, and only comparable by solvent soluble-typetop-coat TSP3A.
Databáze: OpenAIRE