TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System
| Autor: | Vladimir S. Plotnikov, Ilya Smirnov, Tamara Mekhantseva, Alexey Kirillov, E. V. Pustovalov, O. V. Voitenko, B. N. Grudin |
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| Rok vydání: | 2012 |
| Předmět: |
Conventional transmission electron microscope
Optics Materials science Reflection high-energy electron diffraction Electron tomography business.industry Scanning transmission electron microscopy General Engineering Scanning confocal electron microscopy Energy filtered transmission electron microscopy Electron beam-induced deposition business High-resolution transmission electron microscopy |
| Zdroj: | Advanced Materials Research. 590:9-12 |
| ISSN: | 1662-8985 |
| Popis: | This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS). |
| Databáze: | OpenAIRE |
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