Optimization and Modeling of Antireflective Layers for Silicon Solar Cells: In Search of Optimal Materials
| Autor: | Alassane Diaw, Oumar Absatou Niasse, Mamadou Diop, Moulaye Diagne, Joseph Sarr, Nacire Mbengue, Bassirou Ba, Ousmane Ba |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Silicon business.industry chemistry.chemical_element 02 engineering and technology General Medicine engineering.material 021001 nanoscience & nanotechnology 01 natural sciences Reflectivity law.invention Reflection (mathematics) Anti-reflective coating Coating chemistry law 0103 physical sciences engineering Optoelectronics Antireflection coating 0210 nano-technology business Layer (electronics) Refractive index |
| Zdroj: | Materials Sciences and Applications. :705-722 |
| ISSN: | 2153-1188 2153-117X |
| Popis: | Depositing an antireflection coating on the front surface of solar cells allows a significant reduction in reflection losses. It thus allows an increase in the efficiency of the cells. A modeling of the refractive indices and the thicknesses of an optimal antireflection coating has been proposed. Thus, the average reflective losses can be reduced to less than 8% and less than 2.4% in a large wavelength range respectively for a single-layer and double-layer anti-reflective coating types. However, the difficulty of finding these model materials (materials with the same refractive index) led us to introduce two notions: the refractive index difference and the thickness difference. These two notions allowed us to compare the reflectivity of the antireflection layer in silicon surface. Thus, the lower the refractive index difference is, the more the material resembles to the ideal material (in refractive index), and thus its reflective losses are minimal. SiNx and SiO2/TiO2 antireflection layers, in the wavelength range between 400 and 1100 nm, have reduced the average reflectivity losses to less than 9% and 2.3% respectively. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|