| Autor: |
Chunsheng Li, Shaoyong Wu, Shan Jiang, Lijun Diao, Ming He, Songsheng Jiang |
| Rok vydání: |
2002 |
| Předmět: |
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| Zdroj: |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 194:393-398 |
| ISSN: |
0168-583X |
| DOI: |
10.1016/s0168-583x(02)01031-5 |
| Popis: |
The half-life of 79 Se has been re-measured with projectile X-rays detection (PXD) in accelerator mass spectrometry after a new PXD system had been set up in China Institute of Atomic Energy (CIAE). The PXD technique has been used for separation of 79 Se from its isobar, 79 Br. The detection efficiency of 79 Se K α X-rays is obtained from that of 80 Se after energy correction. The atom number of 79 Se in each sample is deduced from the measured ratios of 79 Se/Se. From the measured decay rates of each sample, the half-life is deduced to be (2.80±0.36)×10 5 a. In order to check the reliability of the result of 79 Se half-life, the 75 Se half-life is also measured with PX-AMS method. The measured half-life of 75 Se is in good agreement with well-known literature value. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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