Data-Driven Fault Prognosis Based on Incomplete Time Slice Dynamic Bayesian Network
| Autor: | Zhengdao Zhang, Linbo Xie, Feilong Dong |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
0209 industrial biotechnology
Computer science Node (networking) Gaussian 020208 electrical & electronic engineering Inference Bayesian network Conditional probability 02 engineering and technology Fault (power engineering) Data-driven symbols.namesake 020901 industrial engineering & automation Control and Systems Engineering 0202 electrical engineering electronic engineering information engineering symbols Algorithm Subspace topology Dynamic Bayesian network |
| Zdroj: | IFAC-PapersOnLine. 51:239-244 |
| ISSN: | 2405-8963 |
| DOI: | 10.1016/j.ifacol.2018.09.306 |
| Popis: | Based on a dynamic Bayesian network with an incomplete time slice and a mixture of the Gaussian outputs, a data-driven fault prognosis method for model-unknown processes is proposed in this article. First, according to the requirement of fault prognosis, an incomplete time slice Bayesian network with unknown future observed node is constructed. Moreover, the future states are described by the current measurements and his historic data in the form of conditional probability. Second, according to the completed part of historical data, a parameter-learning algorithm is used to obtain network parameters and the weight coefficients of distribution components. After that, using such weight coefficients as input-output data, the subspace identification method is employed to build a forecasting model which can predict weight coefficients at next sampling time. To achieve fault prognosis, an inference algorithm is developed to predict hidden faults based on the distribution of the measurements directly. Furthermore, the remaining useful life of process is estimated via iterative one-step ahead prognosis. As an example, the proposed method is applied to a continuous stirred tank reactor system. The results demonstrate that the proposed method can efficiently predict and identify the fault, and estimate the remaining useful life of process, even though the measurements are partly missing. |
| Databáze: | OpenAIRE |
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