Microwave-frequency alternating current scanning tunneling microscopy by difference frequency detection: Atomic resolution imaging on graphite
| Autor: | D. H. Rapoport, J. Schmidt, H.-J. Fröhlich |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Microscope
Materials science business.industry Scanning tunneling spectroscopy Spin polarized scanning tunneling microscopy Conductive atomic force microscopy Scanning capacitance microscopy Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Electrochemical scanning tunneling microscope law.invention Scanning probe microscopy Optics law Scanning tunneling microscope business Instrumentation |
| Zdroj: | Review of Scientific Instruments. 70:3377-3380 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1149922 |
| Popis: | We present a detailed description of an experimental setup for alternating current scanning tunneling microscopy, in which two slightly detuned high frequency signals are mixed at the tunneling junction and the resulting difference frequency signal is amplified using conventional scanning tunneling microscope electronics. This signal is used to control the distance between the microscope tip and the sample. With graphite as a model surface atomic resolution images have been obtained. It is demonstrated that the origin of the generated signal on graphite is the nonlinearity of the static current–voltage characteristics. |
| Databáze: | OpenAIRE |
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