Reduced distributions of the set current and the voltage of unipolar resistance switching in a current-biased set process
| Autor: | Chansoo Yoon, Bo Soo Kang, Min Chul Chun, Bae Ho Park, Young-Sun Kwon, Hye-Jin Shin, Gyuyeon Jang, Keundong Lee, Sang-Chul Na |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Non-blocking I/O Process (computing) Mode (statistics) General Physics and Astronomy 02 engineering and technology 021001 nanoscience & nanotechnology Topology 01 natural sciences Set (abstract data type) 0103 physical sciences Overshoot (signal) Current (fluid) 0210 nano-technology Reset (computing) Voltage |
| Zdroj: | Journal of the Korean Physical Society. 68:1467-1471 |
| ISSN: | 1976-8524 0374-4884 |
| Popis: | The set process in a unipolar resistance switching Pt/NiO/Pt thin film was conducted in two different ways: the current-biased set process (current sweep mode) and the voltage-biased set process (voltage sweep mode). In the current-biased set process, a compliance current setting was not necessary for continuing stable resistance switching. The resistance of the low resistance state, the reset and the set switching parameters were compared in both modes of the set processes. The distributions of the set parameters were found to be effectively reduced in the current-biased set process. These intriguing properties can be attributed to the prevention of an overshoot current during the set transition. |
| Databáze: | OpenAIRE |
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