Analysis of Fault Diagnosis Algorithm for Thermal Imaging Camera Circuit Board Using Machine Learning
Autor: | Seon-Mo Kim, Ha-Ye-Rim Lee, In-Soo Hwang, Jang-Wook Hur |
---|---|
Rok vydání: | 2022 |
Zdroj: | Journal of the Korea Academia-Industrial cooperation Society. 23:118-124 |
ISSN: | 2288-4688 1975-4701 |
DOI: | 10.5762/kais.2022.23.10.118 |
Databáze: | OpenAIRE |
Externí odkaz: |