Analysis of Fault Diagnosis Algorithm for Thermal Imaging Camera Circuit Board Using Machine Learning

Autor: Seon-Mo Kim, Ha-Ye-Rim Lee, In-Soo Hwang, Jang-Wook Hur
Rok vydání: 2022
Zdroj: Journal of the Korea Academia-Industrial cooperation Society. 23:118-124
ISSN: 2288-4688
1975-4701
DOI: 10.5762/kais.2022.23.10.118
Databáze: OpenAIRE