Electron wave diffraction by semiconductor gratings: Rigorous analysis and design parameters

Autor:	Elias N. Glytsis, Thomas K. Gaylord, Gregory N. Henderson
Rok vydání:	1991
Předmět:	Diffraction Materials science Physics and Astronomy (miscellaneous) business.industry Physics::Optics Bragg's law Acousto-optics Grating Diffraction efficiency Optics Electron diffraction Diffraction topography business Diffraction grating
Zdroj:	Applied Physics Letters. 59:440-442
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.105456
Popis:	An exact rigorous coupled‐wave analysis has been developed to model ballistic electron wave diffraction by gratings with periodic effective mass and/or potential energy variations. Design expressions have been derived to calculate diffracted angles, to identify evanescent orders, and to identify the Bragg condition. Design expressions for Bragg regime (up to 100% diffraction efficiency in a single order) and Raman–Nath regime (high diffraction efficiency divided among multiple orders) diffraction are presented along with example Ga1−xAlxAs grating designs. Design procedures for ballistic electron switches, multiplexers, spectrometers, and electron waveguide couplers are described.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b0f78522a55b5c50a9c81a3232508be9 https://doi.org/10.1063/1.105456 Zobrazit plný text záznamu