The effect of Cr underlayer thickness on magnetic and structural properties of CoPtCr thin films

Autor:	M. Mirzamaani, P. R. Ivett, D. R. Timmons, K. E. Johnson, T. Yogi, S. E. Lambert
Rok vydání:	1990
Předmět:	Materials science Metallurgy Alloy Crystal orientation General Physics and Astronomy chemistry.chemical_element engineering.material Granular material Epitaxy Chromium chemistry Sputtering engineering Thin film Composite material Layer (electronics)
Zdroj:	Journal of Applied Physics. 67:4686-4688
ISSN:	1089-7550 0021-8979
Popis:	Thin Co‐based alloy films have shown important recording, magnetic, and structural changes when grown on Cr underlayers of different thicknesses. We have investigated these properties using several different CoPtCr compositions on Cr underlayers ranging from 0 to 200 nm in thickness. We report epitaxial growth of the hcp Co (11.0) planes on the (100) planes of bcc Cr for the first time on a disk appropriate for magnetic recording. The 〈11.0〉 Co preferred orientation occurs only when the Cr underlayer has a 〈100〉 preferred orientation. The 〈100〉 preferred orientation in the Cr layer results from the use of sputtering rates above 150 nm/min and only persists to thicknesses of about 50 nm. The thin Cr underlayers (
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b0da254ad2b478ffd58a6bbb8b3f728d https://doi.org/10.1063/1.344801 Zobrazit plný text záznamu