Microchannel water cooling of silicon x‐ray monochromator crystals

Autor:	E. Schmitt, W. H. Tompkins, C. Troxel, J. H. White, C. Henderson, J. Arthur, D. H. Bilderback, R. J. Contolini, T. Settersten
Rok vydání:	1992
Předmět:	Physics Silicon business.industry Wiggler chemistry.chemical_element Synchrotron radiation Synchrotron law.invention Crystal Optics chemistry law Water cooling business Instrumentation Power density Monochromator
Zdroj:	Review of Scientific Instruments. 63:433-436
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1142722
Popis:	The use in silicon x‐ray monochromator crystals of water cooling channels with dimensions optimized for efficient heat transfer from silicon to water has been investigated. Such channels are typically about 40 μm wide and 400 μm deep. Procedures have been found for reliably producing microchannel‐cooled crystals with very small amounts of residual strain. These crystals have been tested at a high‐power wiggler beam line at the Cornell High Energy Synchrotron Source, using an x‐ray beam having total power in excess of 250 W and normal‐incidence power density greater than 5 W/mm2. Under these conditions, the surface‐temperature rise of a typical microchannel‐cooled crystal was less than 5 °C, and degradation of the (111) rocking curve at 12 keV was very slight. The cooling efficiency is consistent with analytic calculations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b0a0c80eacdf316a2a0755694b277c36 https://doi.org/10.1063/1.1142722 Zobrazit plný text záznamu