Morphological parameters in varieties of silk fibers determined by small-angle X-ray scattering

Autor: V. Annadurai, J. David Londono, R. K. Somashekar, R. Gopalkrishne Urs
Rok vydání: 2002
Předmět:
Zdroj: Journal of Applied Polymer Science. 85:2382-2388
ISSN: 1097-4628
0021-8995
DOI: 10.1002/app.10873
Popis: The small-angle X-ray scattering intensity data recorded from silk fibers were compared with the simulated data obtained from a linear paracrystalline model. For this purpose, an exponential distribution function for the amorphous and crystalline phase lengths was used. There are significant changes in phase lengths because of amino acid compositional changes in different families of silk fibers. © 2002 Wiley Periodicals, Inc. J Appl Polym Sci 85: 2382–2388, 2002
Databáze: OpenAIRE