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Publisher Summary This chapter covers the use of Scanning Electron Microscope (SEM) in the characterization of zeolites. The size of the zeolites that can be studied with SEM is between 20 nm and 20 μm. Regarding zeolite sample preparation, two approaches are possible: for the ultimate picture and for fast exploration. In case the crystals are very small or flat oriented on the support, it is difficult to make a picture of the crystallite with enough contrast to the background, actually the support. Not only the form, but also the aspect ratio of crystals, can be well studied. In particular, the crystal size and aspect ratio of crystals are determined with accuracy only when a crystal face is oriented perpendicular to the beam. The resolution of SEM in the world of microscopy clearly bridges Optical Microscopy (OM) with Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). |
