Effects of partially broken HF signal return on different packaging levels
Autor: | T. Gneiting, Roland Frech, T.-M. Winkel |
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Rok vydání: | 2008 |
Předmět: | |
Zdroj: | 2008 IEEE-EPEP Electrical Performance of Electronic Packaging. |
DOI: | 10.1109/epep.2008.4675928 |
Popis: | Electro magnetic field effects for broken high frequency (HF) signal returns are analysed for discontinuities in different packaging levels. Board connectors with a huge signal count and high speed signals as well as typical multi chip module structures are analysed using 3D field calculations. Resulting coupling effects were calculated and also verified with time domain measurements. The results are discussed with respect to the impact on signal integrity. |
Databáze: | OpenAIRE |
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