Substrate Effects on the Growth Behavior of Atomic-Layer-Deposited Ru Thin Films Using RuO4 Precursor and N2/H2 Mixed Gas

Autor: Woojin Jeon, Cheol Hyun An, Sang Hyeon Kim, Cheol Seong Hwang, Dae Seon Kwon, Dong Gun Kim, Woongkyu Lee, Cheol Jin Cho
Rok vydání: 2019
Předmět:
Zdroj: The Journal of Physical Chemistry C. 123:22539-22549
ISSN: 1932-7455
1932-7447
Popis: The growth behaviors of atomic-layer-deposited (ALD) Ru thin films using the RuO4 precursor and N2/H2 mixed reduction gas on Ta2O5 thin-film/Si substrates were examined. The Ru films deposited on t...
Databáze: OpenAIRE