Characteristics of Ag-Se/Ge-Se as a Recording Medium for X-Ray Holograms

Autor:	Yoh Somemura, Akira Yoshikawa, Yasushi Utsugi
Rok vydání:	1992
Předmět:	Materials science Chalcogenide business.industry General Engineering Holography X-ray General Physics and Astronomy Diffraction efficiency law.invention Wavelength chemistry.chemical_compound Optics chemistry law Dispersion (optics) Thin film business Refractive index
Zdroj:	Japanese Journal of Applied Physics. 31:3712
ISSN:	1347-4065 0021-4922
DOI:	10.1143/jjap.31.3712
Popis:	The characteristics of Ag-Se/Ge-Se are evaluated as a recording medium for soft X-ray holograms. An Ag-Se/Ge-Se film is feasible for real-time observation with high-resolution X-ray images because soft X-rays induce reflectance changes on this film without any additional processes after exposure. The variations in reflectance dependence on Ag-photodoping dispersion depth into chalcogenide film are analyzed by using multi-layer reflection. The trend of variations in reflectance changes greatly for a total thickness difference of only ±10 nm. The dispersion depth is dependent on the X-ray exposure dose. The refractive index of Ag-Se (Ag-photodoped Ge-Se) is estimated to be 2.95±0.05 at wavelengths ranging from 600 to 900 nm. The value of the diffraction efficiency is computed and also confirmed to be dependent on the exposure dose.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::afd0a38e201400da853d259d2ca2d656 https://doi.org/10.1143/jjap.31.3712 Zobrazit plný text záznamu