An atomic-force-microscopy study of the structure of surface layers of intact fibroblasts
Autor: | S. A. Podzorova, K. I. Timoshchuk, A. V. Ankudinov, I. A. Nyapshaev, A. V. Kipenko, M. M. Khalisov, Boris V. Krylov, V. A. Penniyaynen |
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Rok vydání: | 2017 |
Předmět: |
010302 applied physics
Surface (mathematics) Materials science Physics and Astronomy (miscellaneous) Atomic force microscopy Shell (structure) Nanotechnology 02 engineering and technology Substrate (electronics) Radius 021001 nanoscience & nanotechnology Curvature 01 natural sciences medicine.anatomical_structure 0103 physical sciences Microscopy medicine Composite material 0210 nano-technology Fibroblast |
Zdroj: | Technical Physics Letters. 43:209-212 |
ISSN: | 1090-6533 1063-7850 |
DOI: | 10.1134/s1063785017020195 |
Popis: | Intact embryonic fibroblasts on a collagen-treated substrate have been studied by atomic-force microscopy (AFM) using probes of two types: (i) standard probes with tip curvature radii of 2–10 nm and (ii) special probes with a calibrated 325-nm SiO2 ball radius at the tip apex. It is established that, irrespective of probe type, the average maximum fibroblast height is on a level of ~1.7 μm and the average stiffness of the probe–cell contact amounts to ~16.5 mN/m. The obtained AFM data reveal a peculiarity of the fibroblast structure, whereby its external layers move as a rigid shell relative to the interior and can be pressed inside to a depth dependent on the load only. |
Databáze: | OpenAIRE |
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