Application of the K-Standards Algorithm for the Clustering Problem of Production Batches of Semiconductor Devices

Autor:	Viktor I. Orlov, Ivan P. Rozhnov, Lev A. Kazakovtsev, Natalya L. Rezova, Vyacheslav P. Popov, Dmitriv L. Mikhnev
Rok vydání:	2021
Zdroj:	2021 XV International Scientific-Technical Conference on Actual Problems Of Electronic Instrument Engineering (APEIE).
DOI:	10.1109/apeie52976.2021.9647632
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::afc95a89a2a8ee98a71cc466f4c6f084 https://doi.org/10.1109/apeie52976.2021.9647632 Zobrazit plný text záznamu