Probe‐surface interaction in near‐field optical microscopy: The nonlinear bending force mechanism

Autor:	Rainer G. Ulbrich, J. Schöfer, P. G. Blome, M. J. Gregor
Rok vydání:	1996
Předmět:	Physics Physics and Astronomy (miscellaneous) business.industry Liquid helium Surface force Resonance Near and far field Molecular physics law.invention Tilt (optics) Optics law Microscopy business Adiabatic process Non-contact atomic force microscopy
Zdroj:	Applied Physics Letters. 68:307-309
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.116068
Popis:	The probe‐surface interaction underlying the ‘‘shear‐force’’ distance control commonly used in near‐field microscopy has been studied in detail by measuring dither resonance profiles and approach curves in vacuum and liquid helium. Simulations based on a nonlinear oscillator model considering the probe geometry, its elastic properties, adiabatic short‐range probe‐surface contact, and the surface tilt angle, are in excellent agreement with the experiments. We prove conclusively that a nonlinear bending force mechanism with parametric mode conversion is responsible for the observed phenomena.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::afbc6f546a8fbbebbac128f32fbaf901 https://doi.org/10.1063/1.116068 Zobrazit plný text záznamu