Measurement of grain-boundary segregation by STEM-EDX analysis

Autor:	J.M. Titchmarsh, I.A. Vatter
Rok vydání:	1989
Předmět:	Field electron emission Auger electron spectroscopy Materials science Monte Carlo method Scanning transmission electron microscopy Analytical chemistry Grain boundary Electron source Instrumentation Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials
Zdroj:	Ultramicroscopy. 28:236-239
ISSN:	0304-3991
Popis:	Grain-boundary segregation has been measured by Energy-Dispersive X-ray Analysis (EDX) using a scanning transmission electron microscope with a field emission electron source (FEG-STEM). Monte Carlo calculations have been performed to assist in the quantification of data and to explore the likely influence of variations in experimental parameters. A comparison of results derived from EDX and Auger spectroscopy (AES) of the same materials is described.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::af8b0b330238d93708d2d93c34beb8f3 https://doi.org/10.1016/0304-3991(89)90301-x Zobrazit plný text záznamu