Dependence of solar cell contact resistivity measurements on sample preparation methods
| Autor: | Rob Janoch, Kristopher O. Davis, Andrew M. Gabor, Andrew Anselmo, Adam M. Payne, Vijay Yelundur, Geoffrey Gregory |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
business.industry Electrical engineering 02 engineering and technology STRIPS 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences law.invention law Electrical resistivity and conductivity Solar cell Optoelectronics Wafer Sample preparation 0210 nano-technology business Laser scribing Common emitter |
| Zdroj: | 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC). |
| Popis: | The measurement of contact resistivity between the grid metallization of a solar cell and the underlying silicon wafer is most conveniently performed by cutting strips from solar cells rather than fabricating dedicated structures with variable spaced contacts. We studied the effect of strip width on the measurements and found the lowest values in the range of 10–15 mm. We found laser scribing conditions whereby strips could be successfully isolated on the emitter side without snapping strips from the rest of the cell. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|